RoodMicrotec

RoodMicrotec services

OVERVIEW

Qualification and Reliability tests

RoodMicrotec carry out qualifications according to your specifications as well as to specific market standards such as AEC-Q 100 / 101/ 200, ESCC 9020 / 9010/9000, MIL-STD 883/202, JEDEC 22, TELCORDIA GR 468/1221/326/1312, IEC 60068-2-XX. Even if qualification and reliability tests are not required for your products, it might be worth it to consider such possibilies as it would improve long-term reliability and reduce breakdown costs considerably. We provide following services in the field of testing and qualification:

Preparation of test concepts and qualification plans
Qualification
Life-tests, burn-in and run-in
Highly Accelerated Stress Test (HAST) and autoclave
Temperature-Humidity-Bias (THB)
Environmental simulations and artificial ageing by means of environmental tests from -70°C to +300 °C and 10 to 98 percent humidity (constant ,cyclical or as shock)
Mechanical tests such as shock, bump or vibration (sine wave vibration and random vibration)
ESD tests
Mechanical and thermal qualification tests
- Life-test and burn-in of LEDs and laser diodes with online measurement
- Failure analysis on module and chip-level
- Risk analysis of new technologies
- Measurement of eye safety of LEDs and lasers
(Opto-) electronic characterization
Physical construction analysis / solderability test
Determination and testing of moisture classes

Test Operations

In RoodMicrotec in-house test floor in Nördlingen they are able to perform all electrical and optoelectronic tests with modern testing equipment, and as needed also mechanical and environmental tests. RoodMicrotec test your chip under grey room conditions up to clean room conditions of class 6 (1000 particles/cubic feet) prior to assembly in the end product.

Wafer testing from 6 to 12 inch
Component testing on packages for example QFN, TSSOP, CSP & PLCC
End-of-line testing
Burn-in
Screening
Production testing -40C – +125
Optoelectronic testing: We carry out production and selection tests on image sensors, LEDs, laser diodes and fiber optic components. We provide the following services:
Characterization of optical, thermical and electrical elements:
- Testing of specified parameters
- Selection of LEDs

Test Engineering

RoodMicrotec experienced engineers develop individual test programs for optimal and efficient testing and adapting of your chips or optoelectronic components such as image sensors, photodiodes or opto ASICs. RoodMicrotec support you from the first ideal until the delivery of serial parts with following services:

Development of test concepts
Development of test software and hardware for ATE
Wafer testing from 6 to 12 inch
Final test: gravity and pick-and-place handlers
Characterisations
Test program conversion
Test data evaluation and modification and optimisation of test solutions, especially test time reduction
Development electrical test for qualification and failure analysis
Mixed-signal converting
Converting of analog and digital as well as high frequency devices

Device Programming

By using modern handling systems we can customize your components according to your requirements. Programming with fully automatic machines is possible up to 16 devices simultaneously. Laser marking and tape and reel can be carried out in parallel in one work step – a cost-effective solution. We offer our programming service for a variety of different packages and for all programmable logic circuits, including Flash, One Time Programmables – OTP devices, Erasable Programmable Ready Only Memory (Eproms) or µControllers with memory.

Failure & Technology Analysis

If products or single components fail, RoodMicrotec will find out the root cause as quickly as possible, so that the error can be solved at an early stage to avoid further damage. With RoodMicrotec services we test the quality and reliability of components, assemblies, systems and power electronics. In this way, RoodMicrotec help you to analyse the failure precisely and define suitable measures. We are experts for the following procedures: