T-Plus

Japan

overview

Microwave Measurement Solution

Products:

– Probe Head
– RF Probe Card
– RF Test Fixture
– Probe Station for wafer / PCB
– Measurement Service / Measurement Accessories

Products List

Probe Head
Probe Head
RF Probe Card
RF Probe Card
RF Test Fixture
RF Test Fixture
Probe Station for wafer / PCB

Probe Station for wafer / PCB

 

Measurement Service / Measurement Accessories
Measurement Service / Measurement Accessories

RF Probe

Feature

  • Low insertion loss and return loss.
  • Air coplanar design.
  • Small Probe Mark
  • Wide range of pitch selection.
  • Probe Tip Replacement service available. (Limited times replacement)
Frequency (GHz) # of RF Port Connector Attach Type
Angle Vertical
26 Single PDF PDF
Dual / Differential PDF PDF
40 Single PDF PDF
Dual / Differential PDF PDF
50 Single PDF PDF
Dual / Differential PDF PDF
67 Single PDF PDF
Dual / Differential PDF PDF
110 Single PDF PDF
WR15 Single Please contact us and we will send you data sheet
WR12 Single
WR10 Single
WR8 Single
WR6 Single
WR5 Single
WR3 Single

Adjustable Dual RF Probe

Adjustable Dual RF Probe

Feature

  • Adjust between GS/SG, GSG/GSG, or S/S up to 4,000um (4mm / X axis only)
  • Easy handling, micrometer structure. (Patented)
  • Low Insertion Loss and Return Loss up to 67GHz.
  • RF Air Coplanar probe (require uniformed pitch and configuration) , OR Custom Fabrication RF Cantilever probe available. (cannot be mixed air coplanar probe)

Adjustable Dual RF Probe Reference Spec: PDF

Custom Design RF Probe (RF Cantilever Probe)

Feature

  • Low Insertion Loss and Return Loss up to 67GHz
  • RF Cantilever probe technology. Custom Fabrication
  • Unique configuration, un-uniformed pitch, different tip planarity alignment available.
  • Max 10 RF ports available.
  • High Power probe available.
  • Non Initial Cost requirement, Short lead time.
  • Custom design Calibration kit available.

RF Cantilever Probe Reference Spec: PDF

DC + RF Probe

DC + RF Probe

Feature

  • Low Insertion Loss and Return Loss up to 67GHz.
  • RF Air Coplanar probe (require uniformed pitch and configuration) , OR Custom Fabrication RF Cantilever probe available. (cannot be mixed air coplanar probe)
  • Cantilever DC Probes up to around 25pins (depend on pitch requirement)
  • Minimum 50um pitch available
RF Pin Type Frequency (GHz) Spec
Uniformed Pitch and configuration 40 PDF
50 PDF
67 PDF
Un-Uniformed Pitch / Custom configuration Max 67 TBD

DC Probe

DC Probe

Feature

  • Minimum 50um pitch available.
  • Up to 34pin (standard) / Please ask above 34pin availability.
  • Custom Fabrication Cantilever probes.
  • Long life cycle, Durable
  • Non Initial Cost requirement.
Number of Pin Count Spec
1 to 14 PDF
14 to 26 PDF
26 to 34 PDF

Calibration Substrate

Calibration Substrate

Feature

  • Accurate resistance value control (+/- 0.003%)
  • SOLT / TRL calibration available
  • Custom design available
Configuration Available Pitch (um)
Min Max
GS (SG) 50 1000
GSG 50 1000
GSSG 50 TBD
GSGSG 50 1000
Custom Design Please ask

 

RF Probe Card

RF Probe Card

Feature

  • Low Insertion Loss and Return Loss up to 67GHz.
  • RF Air Coplanar probe (require uniformed pitch and configuration) , OR Custom Fabrication RF Cantilever probe available. (cannot be mixed air coplanar probe and RF cantilever)
  • Cantilever DC Probes up to around 25pins (depend on pitch requirement)
  • Minimum 50um pitch available
  • Long Life Cycle (typical over 2M contact in Auto probe mode/Cantilever type)
  • Non Initial Cost requirement, Short lead time
  • De-Embed File Available
Typical Spec 10GHz PDF
40GHz PDF
67GHz PDF

 

RF Test Fixture

RF Test Fixture

Feature

  • Low Insertion Loss and Return Loss.
  • Original design RF Contactor design
  • Easy Handling, Stable contact
  • Available for Bare Chip, PKG IC, Electric Module, E/O (O/E) Module and Substrate.
  • Custom design and OIF standard design (100G Tx/Rx)
  • Maximum 1,000um (1mm) pitch available
  • Perfect contact to RF Lead (Non Stub, impedance match structure)
  • Custom design calibration kit / De-Embed File available

OIF Standard, 100G DP-QPSK Test Fixture Spec: PDF

 

Probe Station for wafer / PCB

Probe Station for wafer / PCB

Feature

  • Optimized design probe station.
  • Easy handling
  • Perfect contact repeatability.
  • Frequency Extender Mount type available.
  • Custom design available

 

SPEC

Standard 6inch Wafer Manual Probe Station: PDF

Keysight N1055A TDR + Probe Positionar: PDF

Measurement Service / Measurement Accessories

T Plus collaborate with MoDeCH Co. Ltd. as a measurement alliance partner. Modech has high level of RF measurement technology and knowledge background.Our measurement Alliance, effective use of each of the technical background and mutual use a different measurement system held in each other. Thus, we could provide high technical level of measurement service with wide range of different measurement service at a reasonable price.

Also, we have meeting to improve the service, we have both side opinion, one is probe manufacturer other side is probe user. Therefore, we can have detailed feedback and improve our measurement service and product quality easier.

Available Service

  • RF Measurement
    -S Parameter (~325GHz)
    -RF Performance (except S Parameter)
    -Load Pull (~67GHz)
  • High Speed Digital Device
    -Differential Line, Device, PKG measurement
    -Eye Pattern
    -Time Domain (~50GHz)
  • Noise
    -1/f Noise
    -Noise Figure, Noise Parameter

Measurement Service / Measurement Accessories

 

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